Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 and interpreting the data generated

and interpreting the data generated by near field scan (NFS) measurement

additional measures might need to be taken to those recommended in this standard

c)      The definition of which average detector is used for emission measurements at frequencies above 1GHz and that results using a peak detector are acceptable for all measurements

BS EN 2349-317 standard specifies a method for determining the service life of coil switching devices in relays and contactors

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 and interpreting the data generated1 Scope This part of IEC 60749 provides a steady state temperature and humidity bias life test for the purpose of evaluating the reliability of non hermetic packaged solid state devices in humid environments. This test method is considered destructive.