JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working AMAT Applied Materials Part No:

AMAT Applied Materials Part No: 0190-28862

Model No: AC9-NCCCCC-00

img{max-width:100%} SVG Silicon Valley Group 99-80306-01 Nikon Interface Board PCB 90S DUV Working

Inventory # CONJ-1934

JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working AMAT Applied Materials Part No:JEOL Column Electron Detector Assembly JWS 2000 Wafer Defect Review SEM Working Part No: Electron Detector Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Detector Assembly is working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item