JEOL Column Mechanical Lens Assembly JWS-2000 Wafer Defect Review SEM Working Removed from a Nikon NSR-S307E

Removed from a Nikon NSR-S307E DUV Scanning System BMU Unit Installed Component

7200-0459-04

img{max-width:100%} Aera PI-98 Mass Flow Controller MFC AMAT 0190-34218 Reseller Lot of 12 Working

Part No: 0021-20823

JEOL Column Mechanical Lens Assembly JWS-2000 Wafer Defect Review SEM Working Removed from a Nikon NSR-S307EJEOL Column Mechanical Lens Assembly JWS 2000 Wafer Defect Review SEM Working Inventory # CONF 1320 Part No: Column Mechanical Lens Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Mechanical Lens Assembly JWS 2000 Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but