E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Revision:SEMI E183-0123 - Current 1 Introduction

1  Introduction

Unless the part of speech is given for any particular term

This Document specifies the external features and dimensions of the 450 mm carrier

org in November 2013

E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Revision:SEMI E183-0123 - Current 1 IntroductionThis Specification describes a data and event sharing and streaming methodology for semiconductor test and related operations. The scheme fully supports legacy equipment and allows equipment vendors the flexibility to provide additional data items via extensions. Real time, historical, and widely distributed data are fully supported. Provenance of all data is supported via customizable metadata along with cryptographic hashing and signing.