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G00600 - SEMI G6 - 検査方法 封止リング平坦度 StdTpc-Physical Interfaces SEMI M23-0811 (Reapproved 0218)
G00600 - SEMI G6 - 検査方法 封止リング平坦度 StdTpc-Physical Interfaces SEMI M23-0811 (Reapproved 0218)
$180.00
Description
SEMI M23-0811 (Reapproved 0218)
この文書は，その他の
SEMI E133-1110 (technical revision)
very small densities of these impurities (»1010 atoms/cm3) reduce the carrier recombination lifetime and adversely affect device and circuit performance
G00600 - SEMI G6 - 検査方法 封止リング平坦度 StdTpc-Physical Interfaces SEMI M23-0811 (Reapproved 0218)38. 382 mm0. 330 8. 382 mm0. 330 Referenced SEMI Standards None.
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